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Research Seminar of Dr. Xinhui Lu from the Chinese University of Hong Kong

Research Seminar of Dr. Xinhui Lu from the Chinese University of Hong Kong


Lecture Time:  16:00 on 5th July, 2019

Lecture Room: C501 of Science and Innovation Building

Lecture Title: Synchrotron X-ray Scattering based Third GenerationSolar Cell Studies


Xinhui Lu

Chinese University of Hong Kong

Abstract

Nowadays, solar industry becomes the fastest growing industry due to the rising demands to solve energy crisis and environmental problems. Third generation solar cells such as organic and perovskite solar cells are all relying on a semiconducting thin-film active layer to harvest the solar energy. The morphology of the active layer in terms of crystal structure, grain size and nanophase separation behavior is known to be critical to the solar cell device performance. Here, we are going to present our recent work on the active layer morphology and its correlations with device performances for several different types of photovoltaic systems. State-of-art synchrotron-based X-ray scattering techniques are employed for the morphology characterization: grazing incidence wide-angle X-ray scattering (GIWAXS) for Angstrom-scale ordering and grazing incidence small-angle X-ray scattering (GISAXS) for nano-scale ordering.


Biography

Dr. Xinhui Lu iscurrently an assistant professor in the Department of Physics in the Chinese University of Hong Kong. She received her BS degree in Physics from Nanjing University in 2004 and PhD degree in Physics from Yale University in 2010. After that, she served as a postdoctoral research associate at the Condensed Matter Physics and Materials Science Department of Brookhaven National Laboratory, USA for two years before joining in the Department of Physics in CUHK. Dr. Lu’s research interest lies in energy related material science and experimental soft condensed matter physics, including morphology and device performance of organic and perovskite photovoltaic materials, bulk and surface structure of functional thin films and synchrotron x-ray scattering techniques.

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